APPLICATION SPECIFIC INTEGRATED CIRCUITS BY MICHAEL JOHN SEBASTIAN SMITH PDF

Truth tables expressing the logical operation of each CLB in a given design can similarly be extracted. One design-specific test in accordance with an embodiment of the invention takes advantage of such extracted data to verify the logical function provided by each CLB. In the example of FIG. In other words, counter provides the counts depicted in truth table 1, above, and verifies each of the corresponding eight output signals. System employs flip-flop to store the output of LUT for each count, though this is not necessarily required.

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Pedroni, MIT Press. The course instructor may choose to use a different textbook. Please check with your instructor before purchasing. Prerequisite Learning Outcomes At the end of this course, students will be able to: Understand the importance of hardware modeling and specification languages and the unique features of digital systems.

Demonstrate the ability to analyze different delay models. Demonstrate the capability of modeling combinational and sequential circuits. Understand the reuse strategy for complex system design. Understand static timing analysis, delay estimation and synchronization. Understand the design constraints, functional testing and verification. Static Timing Analysis, Timing constraints, false path detection, Timing optimization.

Timing, Metastability Characterization, synchronization, multiple clock domain, ASIC library design, delay estimation. Course Structure Two minute lecture periods per week. Relevant Student Outcomes The following program outcomes are supported by this course: a An ability to apply the knowledge of mathematics, science, and engineering principles.

Prepared by: Xiaoyu Song.

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