It is indispensable for EMI pre-compliance testing during product development, prior to third party testing. The set includes 3 hand-held probes with a built-in pre-amplifier covering the frequency range from kHz to over MHz. Signal feed is via a 1. When used in conjuction with a spectrum analyzer or a measuring receiver, the probes can be used to locate and qualify EMI sources, as well as evaluate EMC problems at the breadboard and prototype level. They enable the user to evaluate radiated fields and perform shield effectiveness comparisons.
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It is indispensable for EMI pre-compliance testing during product development, prior to third party testing. The set includes 3 hand-held probes with a built-in pre-amplifier covering the frequency range from kHz to over MHz.
Signal feed is via a 1. When used in conjuction with a spectrum analyzer or a measuring receiver, the probes can be used to locate and qualify EMI sources, as well as evaluate EMC problems at the breadboard and prototype level. They enable the user to evaluate radiated fields and perform shield effectiveness comparisons. Mechanical screening performance and immunity tests on cables and components are easily performed. The H-Field Near-Field Probe The H-Field probe provides a voltage to the connected measurement system which is proportional to the magnetic radio frequency RF field strength existing at the probe location.
With this probe, circuit RF sources may be localized in close proximity of each other. The H-field will decrease as the cube of the distance from the source.
While investigating a circuit board, the sources are immediately obvious. It is easily noticed which component i. IC causes interference and which does not. In addition, by use of a spectrum analyzer, the maximum amplitude as a function of frequency is easily identified. Therefore, one can eliminate early in the development components which are not suitable for EMC purposes. The effectiveness of countermeasures can be judged easily. One can investigate shields for "leaking" areas and cables or wires for conducted interference.
The High-Impedance Probe The high-impedance probe Hi-Z permits the determination of the radio frequency interference RFI on individual contacts or printed circuit traces. It is a direct-contact probe. Thereby one can measure directly in a circuit without significantly influencing the relationships in the circuit with the probe. One can, for example, measure the quantitative effectiveness of filters or other blocking measures. On printed circuit boards, individual problem tracks can be identified.
It is sensitive enough to be used as an antenna for radio or TV reception. With this probe the entire radiation from a circuit or an equipment can be measured. It is used, for example, to determine the effectiveness of shielding measures. With this probe, the entire effectiveness of filters can be verified by measuring the RFI which is conducted along cables that leave the equipment and may influence the total radiation. In addition, the E-field probe may be used to perform relative measurements for certification tests.
This makes it possible to apply remedial suppression measures so that any re-qualification results will be positive. In addition, pre-testing for certification tests may be performed so that no surprises are encountered during the certification tests.
Hameg HZ530 Benutzerhandbuch
Voodoora The product detailed below complies with the specifications published by RS Components. Save to an existing parts list Save to a new parts list. Save to parts list Save to parts list. Please select an existing parts list. The product does not contain any of the restricted substances in concentrations and applications banned by the Directive, and for components, the product is capable of being worked on at the higher temperatures required by lead—free soldering.
HZ530 Near Field Probes User Manual
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